Shaw Inspection Systems Logo
Contact | Site Map | Legal | Privacy
 
Shaw Inspection Systems
 
Image Library
 
Image Library | Micro-Focus
 
Introduction

Shaw Inspection Systems supply systems, with a wide range of x-ray sources, including micro-focus sources. The principle advantage of micro-focus sources is that they allow the use of geometric magnification. By moving the object closer to the source, the image of the object projected onto the detector becomes increasingly magnified. With conventional industrial tubes this is only possible for modest magnifications, beyond which the image will become increasingly blurred as the x-rays are being emitted from a relatively large area. Micro-focus sources avoid this blurring, by emitting x-rays from a very much smaller area. Consequently the image of the object can be magnified considerably without blurring.

These images have been included to indicate the possible magnification, and resolution that is easily achievable when using such sources.


 
 
Thin Film Resistor Pack 128MB PC133 SDRAM Intel 486 DX Processor
Megatrends Inc AmiKey EPROM
 
 

 RELATED INFORMATION
Micro-Focus
  Thin Film Resistor Pack
  x6.2 Magnification
  x10 Magnification
  x12 Magnification
  x22 Magnification
  x71 Magnification
  x160 Magnification
  128MB PC133 SDRAM
  x1.0 Magnification
  x2.5 Magnification
  x4.2 Magnification
  x6.2 Magnification
  x13 Magnification
  x34 Magnification
  x71 Magnification
  x160 Magnification
  Intel 486 DX Processor
  x2.5 Magnification
  x3.2 Magnification
  x4.2 Magnification
  x6.2 Magnification
  x15 Magnification
  x46 Magnification
  x160 Magnification
  Megatrends Inc AmiKey EPROM
  x3.3 Magnification
  x12 Magnification
  x27 Magnification
  x71 Magnification
  x160 Magnification
       
© Copyright 2008 Shaw Inspection Systems Limited. Site Map | Legal | Privacy